Acterna JDSU HST-2500/3000 SIM CU Copper Module
$99.95
Availability:
Out of stock
SKU
1L39
Condition: Refurbished
Warranty: 90 Day Exchange
Shipping: USA & Worldwide
Request a Quote for
- JDSU HST-2500/3000 SIM CU Dual T/R/G Interface To Copper Module (BC# 15945)
HST-2500/3000 SIM CU Module
The HSTメs copper testing features allow quick turn-up and troubleshooting of the services provided over copper. This includes testing with DVOM, opens, power (Mains) influence (PI), noise, balance, time domain reflectometer (TDR), resistive fault locate (RFL), load coil detect, loss, wideband transmission impairment measurement set (WBTIMS), caller ID, and POTS dialer.
The HST provides process customization through on-board auto tests and allows workflow improvements via connectivity to craft access terminals and back-office systems.
The copper testing features include the following:
For full JDSU HST-3000 SIM CU product specifications, please click here: JDSU HST-3000 SIM CU
The HSTメs copper testing features allow quick turn-up and troubleshooting of the services provided over copper. This includes testing with DVOM, opens, power (Mains) influence (PI), noise, balance, time domain reflectometer (TDR), resistive fault locate (RFL), load coil detect, loss, wideband transmission impairment measurement set (WBTIMS), caller ID, and POTS dialer.
The HST provides process customization through on-board auto tests and allows workflow improvements via connectivity to craft access terminals and back-office systems.
The copper testing features include the following:
- Measuring AC and DC voltage, current, and resistance
- Measuring to opens (length of cable)
- Measuring balance, noise, and power (Mains) influence (PI)
- Locating cable faults with the TDR or RFL
- Detecting load coils
- Measuring loop loss (voiceband) including receiving and sending tones; transmission impairment testing (noise, SNR, return loss)
- Voice service and caller ID (CLID) testing
- WBTIMS and WB2 TIMS testing including sending/ receiving tones; measuring wideband, impulse, and spectral noise; and transmission impairment testing (noise, SNR, return loss, crosstalk)
For full JDSU HST-3000 SIM CU product specifications, please click here: JDSU HST-3000 SIM CU
| Included |
|
|---|